The Significance of Ionic Bonding in Sulfur Dioxide: Bond Orders from X-ray Diffraction Data
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BORIS DOI
Date of Publication
2012
Publication Type
Article
Division/Institute
Author
Luger, Peter | |
Buschmann, Jürgen | |
Schneider, Thomas | |
Schirmeister, Tanja | |
Sobolev, Alexandre N. | |
Jayatilaka, Dylan |
Series
Angewandte Chemie (International ed.)
ISSN or ISBN (if monograph)
1433-7851
Publisher
Wiley-VCH
Language
English
Publisher DOI
Description
A novel refinement technique for X‐ray diffraction data has been employed to derive S-O bond orders in sulfur dioxide experimentally. The results show that ionic S-O bonding dominates over hypervalency.
File(s)
File | File Type | Format | Size | License | Publisher/Copright statement | Content | |
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019_Grabowsky2012_AngewChemIntEd.pdf | text | Adobe PDF | 1.26 MB | publisher | published |