Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories

Marin Carbonne, JohannaJohannaMarin CarbonneKiss, AndrasAndrasKissBouvier, Anne-SophieAnne-SophieBouvierMeibom, AndersAndersMeibomBaumgartner, LukasLukasBaumgartnerBovay, ThomasThomasBovayPlane, FlorentFlorentPlaneEscrig, StephaneStephaneEscrigRubatto, DanielaDanielaRubatto0000-0002-7425-79042024-10-252024-10-252022https://boris-portal.unibe.ch/handle/20.500.12422/164750en500 - Science::550 - Earth sciences & geology500 - Science::540 - ChemistrySurface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratoriesarticle10.48350/17957810.2533/chimia.2022.26