Comparison of two surface reflectivity models and validation with radiometer measurements
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Publisher DOI
Date of Publication
2010
Publication Type
Article
Language(s)
en
Contributor(s)
Schwank, Mike | |
Völksch, Ingo | |
Wigneron, Jean-Pierre | |
Kerr, Yann H. | |
Mialon, Arnaud | |
de Rosnay, Patricia |
Additional Credits
Series
IEEE transactions on geoscience and remote sensing
Publisher
Institute of Electrical and Electronics Engineers IEEE
ISSN
0196-2892
Access(Rights)
metadata.only