On the Reliability of the EEG Microstate Approach.
Publisher DOI
PubMed ID
37410275
Abstract
EEG microstates represent functional brain networks observable in resting EEG recordings that remain stable for 40-120ms before rapidly switching into another network. It is assumed that microstate characteristics (i.e., durations, occurrences, percentage coverage, and transitions) may serve as neural markers of mental and neurological disorders and psychosocial traits. However, robust data on their retest-reliability are needed to provide the basis for this assumption. Furthermore, researchers currently use different methodological approaches that need to be compared regarding their consistency and suitability to produce reliable results. Based on an extensive dataset largely representative of western societies (2 days with two resting EEG measures each; day one: n = 583; day two: n = 542) we found good to excellent short-term retest-reliability of microstate durations, occurrences, and coverages (average ICCs = 0.874-0.920). There was good overall long-term retest-reliability of these microstate characteristics (average ICCs = 0.671-0.852), even when the interval between measures was longer than half a year, supporting the longstanding notion that microstate durations, occurrences, and coverages represent stable neural traits. Findings were robust across different EEG systems (64 vs. 30 electrodes), recording lengths (3 vs. 2 min), and cognitive states (before vs. after experiment). However, we found poor retest-reliability of transitions. There was good to excellent consistency of microstate characteristics across clustering procedures (except for transitions), and both procedures produced reliable results. Grand-mean fitting yielded more reliable results compared to individual fitting. Overall, these findings provide robust evidence for the reliability of the microstate approach.
Date Issued
2024-03
Publication Type
Article
Subject(s)
Subjects
Clustering EEG microstates Fitting Retest reliability Stability
Language(s)
en
Author(s)
Kleinert, Tobias | |
Nash, Kyle | |
Wascher, Edmund |
Journal
Brain topography
Publisher
Springer
ISSN
1573-6792
Access(Rights)
open.access